基于电子控制器的片上可调式性结构设计研究

Design of on-chip adjustable structure based on electronic controller

本研究以JTAG技术为基础,对基于电子控制器的片上可调式性结构进行了设计。在研究的过程中,首先概述了JTAG技术的相关理论,然后基于JTAG协议规范和TAP控制器,设计了一种满足电子控制器的片上通用化可调试性结构,以实现全局地址空间的调试访问。通过对调试结构设计的实验,结果显示,这一调试结构能够缩短调试时间,并能够降低面积开销,同时还具有较可靠的调试链路。

Based on JTAG technology, the on-chip adjustable structure based on electronic controller is designed. In the process of research, firstly, the related theories of JTAG technology are summarized. Then, based on JTAG protocol specification and TAP controller, a debuggable architecture is designed to satisfy the general purpose of electronic controller, so as to realize debugging access to global address space. The experimental results of the debugging structure show that the debugging structure can shorten the debugging time, reduce the area overhead, and has a more reliable debugging link.