星用光电器件位移损伤评估方法

An evaluation method of displacement damage for spacecraft photoelectric devices

位移损伤是导致星用光电器件性能衰退的重要因素之一。文章以GaAs太阳电池、CCD、光电耦合器和光敏晶体管为对象,研究了其敏感电参数随位移损伤剂量D_d的退化行为,建立了相应的退化方程。在此基础上,结合空间辐射环境仿真分析和地面辐照试验,提出了一种通用的位移损伤效应评估方法。利用该方法对拟用于某太阳同步轨道卫星上的光敏三极管的在轨退化行为进行了评估,评估结果证明了该方法的有效性和可行性。

The displacement damage due to the non-ionizing energy loss is one of the most essential factors of the performance degradation of photoelectric devices used in satellite. In this paper, the degradation of some sensitive electrical parameters against the displacement damage dose （Da） is studied, and a fitting formula is established, for the GaAs solar cell, the CCD, the photoelectric coupler, and the phototransistor. Based on the study, combined with the simulation of the space radiation environment and the ground irradiation test, a general method for assessing the displacement damage is proposed. The feasibility and the effectiveness of the method axe shown by evaluating the degradation of a phototransistor to be used on a sun synchronous orbit satellite.