一种基于投影云纹法的三维形貌测量技术及其标定方法

A 3-D profile measurement technique and its calibration method based on projected moiré method

投影云纹法测量物体的三维形貌具有非接触式、快速、全场测量的优势，且计算结果的分辨率和精度都很高。本文提出了一种新的投影云纹系统测量三维形貌的计算和标定方法，这种方法适用于由投影仪直接投影栅线的投影云纹系统，对光路没有特殊相对位置要求，标定过程对设备的要求低，简单易行，仅需一大一小两块平整的标定板即可实现对整个系统的标定。其可行性、正确性以及高精度的特点都被真实物体测量证实。

Projected moir6 method used for 3-D object profile measurement has the advantages of non- contact, rapid and full field measurement, and the resolution and accuracy of calculated results are very high. In this paper, new computing and calibrating methods for 3-D profile measurement by projected moir6 system are proposed. This method is suitable for a projected moir6 system which is directly projecting grid line by projector and has no special relative position requirement for optical paths. The calibration process has only low requirements of equipment and is easy to operate. The calibration of whole system can be realized by using two flat calibration plates： one is large, the other one is small. Its feasibility, correctness and high accuracy are verified by real object measurement.