军用塑封器件分层缺陷可靠性风险评估方法探讨

Discussion on the Risk Assessment Method of the Reliability of Military Plastic Encapsulated Microcircuit with Delamination Defect

目前，国内尚无一种有效的评价方法和途径，对存在分层缺陷的塑封器件在长期使用环境下的适用性进行评定，严重限制了塑封器件在军用型号产品上的推广应用。通过分析军用塑封器件分层缺陷的长期潜在可靠性风险，全面考虑器件在整个使用期内各个阶段的使用环境条件，结合历年来作者在实际工作中对常见塑封器件分层缺陷的统计情况，对实验样品和实验方法进行合理设计，对其分层缺陷的可靠性评估方法进行了探讨。这对后续实验研究工作的开展以及风险评价方案的建立具有重要的指导意义。

At present, there is no effective evaluation method in China to evaluate the applicability of Plastic encapsulated microcircuit （PEM） with delamination defect in the long-term environment, which seriously restricts the popularization and application of PEM in military products. In this paper, by analyzing the potential reliability risk of the delamination defect of the military PEM, considering the environment conditions in all stages of the device during the whole period of use, and combining the statistics of the stratified defects in the past years, experimental samples and experiment method are designed .This paper has important guiding significance for the follow-up research and the establishment of risk assessment plan.