半导体集成电路电源拉偏测试研究

Research on Fluctuation Test of Semiconductor Integrated Circuit Power Supply

半导体集成电路产品的详细规范或数据手册中一般都规定了电源拉偏要求。为了达到该要求,一般而言,IC产品的测试应覆盖电源电压规定的范围,直观的解决方案就是在所有可能的电源电压条件下对所有的参数进行测试和验证。但是在实现过程中,考虑到测试效率和测试成本等因素,需要确定不同门类产品各类参数的最坏电源电压条件,从而进行针对性的拉偏测试,用于提高测试效率并降低成本。

The supply voltage fluctuation requirement of semiconductor integrated circuit products are generally specified in their detailed specifications or data sheet. In order to meet this requirement, in general, the test of IC products should cover the range specified by the supply voltage, and the intuitive solution is to test and verify all the parameters under all possible supply voltages. However, in the implementation process, taking into account factors such as test efficiency and test cost, it is necessary to determine the worst-case power supply voltage conditions for various parameters of different categories of product so as to conduct targeted supply voltage fluctuation test and then improve test efficiency and reduce costs.