上电复位电路在RFID标签中的可测试性设计

The testable design of power on reset circuit in RFID tag

在RFID标签的设计中,系统的功耗及性能一致性至关重要。上电复位电路作为整个系统的初始复位信号,其检测电源电压的大小、一致性和可测试性直接影响到标签的性能好坏和量产后的一致性。本文针对RFID标签对低功耗、高一致性的需求,通过创新设计了一款低功耗的POR模块,针对POR的特点设计了测试电路,成功实现POR电路检测电压的可测试、可筛选和可调整。圆片测试结果符合设计预期,为实现高性能,低成本的标签设计奠定基础。

The characteristic of lower power and coherence is critical for the design of RFID tag. As the initial signal of system, POR （ power on reset ） schematic is very important for the variety of tag performance about the lowerest working voltage for testability and coherence in IC process. The better POR schematic is designed for lower power and testability. The wafer testing result is consistent with expectation. It＇ s very important for better performance and less cost for the design of RFID tag.