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Ba1–xSrxAl2Si2O8系陶瓷晶体结构及微波介电性能 被引量:3

Crystal Structure and Microwave Dielectric Properties of Ba1-xSrxAl2Si2O8 Ceramics
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摘要 采用固相反应法制备Ba1-xSrxAl2Si2O8 (x=0,0.050,0.075,0.100,0.150)介质陶瓷。通过热分析、密度、X射线衍射和扫描电子显微镜等研究Sr2+对Ba1–xSrxAl2Si2O8陶瓷的晶体结构及微波介电性能的影响。结果表明:Sr2+可以有效促进六方相钡长石转变为单斜相钡长石,且当x≥0.075时,转变率达到100%。在x=0.050时,六方相与单斜相共存,样品密度ρ和介电常数εr最小。在0.050≤x≤0.100范围内,随着Sr2+含量的增加,样品密度、介电常数和品质因数Q×f均增大。在0.050≤x≤0.150范围内,随着x值的增大,具有单斜钡长石相样品的谐振频率温度系数向负的方向呈线性发展。Ba1-xSrxAl2Si2O8在1 425℃烧结时微波介电性能最佳:εr=5.95,Q×f=26 619 GHz,τf=–25.1×10^–6 K^–1。 Ba1-xSrxAl2Si2O8 (x=0, 0.050, 0.075, 0.100, 0.150) ceramics were prepared by a solid-state reaction method. The effect of Sr2+ on the crystal structure and microwave dielectric properties of Ba1-xSrxAl2Si2O8 ceramics was investigated by thermal analysis, density measurement, X-ray diffraction and scanning electron microscopy, respectively. The results show that Sr2+ doping promotes a phase transformation from hexacelisian to monocelsian, and the transformation ratio reaches up to 100% when xi〉0.075. The hexacelisian and celsian coexist in ceramics as x=0.050, giving the minimum density (p) and dielectric constant (εr). Moreover, the density, dielectric constant and quality factor (Qxf) of Ba1-xSrxAl2Si2O8 ceramics increase with the increase of Sr2+ content as 0.050≤x≤0.100. The resonant frequency temperature coefficient of the samples becomes negative linearly with the increase of Sr2+ content as 0.050≤x≤0.150. The Ba1-xSrxAl2Si2O8 sintered at 1425 ℃ shows the optimum microwave dielectric properties (i.e.,Qxf=26 619 GHz,εr=5.95 and τf=-25.1×10^-6 K^-1).
作者 宋天秀 丁士华 张瑶 张云 严欣堪 黄龙 张晓云 SONG Tianxiu;DING Shihua;ZttANG Yao;ZHANG Yun;YAN Xinkan;HUANG Long;ZHANG Xiaoyun(School of Material Science and Engineering,XiHua University,Chengdu 610039,China)
出处 《硅酸盐学报》 EI CAS CSCD 北大核心 2018年第9期1191-1195,共5页 Journal of The Chinese Ceramic Society
基金 四川省特种材料及制备技术重点实验室开放课题资助项目(szjj2017-059) 四川省教育厅资助项目(14ZB0126) 四川省粉末冶金工程技术中心资助项目(SC-FMYJ2017-04,SC-FMYJ2017-07)
关键词 单斜钡长石 六方钡长石 晶体结构 微波介电性能 monocelsian hexacelisian crystal structure microwave dielectric properties
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