基于ATE的SoC协议测试方法研究

Research on SoC Protocol Test Method Based on ATE

面对当今复杂SoC器件,开发ATE测试解决方案变成一项越来越困难的任务。测试要求已经从器件参数测试、逻辑功能测试转移到了包括调制、协议测试等在内的系统级测试,从而增加测试支出成本和程序开发时间。讨论通过基于ATE测试系统Smart RDI软件编程的测试方法生成测试矢量,通过构建详细的ATE与器件接口间的协议规则,实现SoC接口协议测试或者通过寄存器设置进行特定模式测试的目的,不需要为数字协议开发所有仿真向量,减少设计到测试创建,转换,传输和下载协议规则的中间阶段的大量时间,灵活地对协议编程实现待测器件设置和测量。

Today＇s complex SoC devices, developing an ATE test solution becomes an increasingly difficult task. Test requirements have been transferred from parametric, logic functional testing to system-level testing, including modulation, protocol testing, etc., increasing test costs and program development time. The paper discusses the test vectors generate by the test method based on ATE software programming. By constructing detailed protocol rules between ATE and device interface, the purpose of SoC interface protocol testing or specific mode testing through register settings is realized. There is no need to develop all simulation vectors for digital protocols, reducing the time spent designing to the intermediate stages of test creation, transformation, transmission, and download protocol rules. It can flexibly program the protocol to realize the setting and measurement of the device to be tested.