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Measurement of impurity lines with two-crystal x-ray spectrometers on EAST

Measurement of impurity lines with two-crystal x-ray spectrometers on EAST
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摘要 To simultaneously measure the He-like and H-like argon spectra, a two-crystal assembly has been deployed to replace the previous single crystal on the tangential x-ray crystal spectrometer.By selecting appropriate crystals with similar Bragg angles, plasma temperature in the range of 0.5 keV≤Te≤10 keV and rotation can be diagnosed based on the He-like and H-like argon spectra. However, due to the added complexity in the two-crystal assembly in which the spectra might be diffracted by two crystals, some additional impurity lines were identified. For example,tungsten(W) lines in different ionization states were diffracted by the He-like and H-like crystal.Additional molybdenum(Mo) lines in the wavelength range of He-like and H-like argon spectra lines were also summarized. The existence of these additional lines caused the fitted temperature to be different from the true values. This paper presents the identified lines through a comparison with available database, which should be included in the fitting procedure. To simultaneously measure the He-like and H-like argon spectra, a two-crystal assembly has been deployed to replace the previous single crystal on the tangential x-ray crystal spectrometer.By selecting appropriate crystals with similar Bragg angles, plasma temperature in the range of 0.5 keV≤Te≤10 keV and rotation can be diagnosed based on the He-like and H-like argon spectra. However, due to the added complexity in the two-crystal assembly in which the spectra might be diffracted by two crystals, some additional impurity lines were identified. For example,tungsten(W) lines in different ionization states were diffracted by the He-like and H-like crystal.Additional molybdenum(Mo) lines in the wavelength range of He-like and H-like argon spectra lines were also summarized. The existence of these additional lines caused the fitted temperature to be different from the true values. This paper presents the identified lines through a comparison with available database, which should be included in the fitting procedure.
作者 杨新帅 胡睿佶 陈俊 王福地 符佳 李颖颖 张洪明 沈永才 尹相辉 吕波 EAST team Xinshuai YANG;Ruiji HU;Jun CHEN;Fudi WANG;Jia FU;Yingying LI;Hongming ZHANG;Yongcai SHEN;Xianghui YIN;Bo LYU(Institnte of Plasma Physics,Chinese Academy of Sciences,Hefei 230031,People's Republic of China;Department of Engineering and Applied Physics,University of Science and Technology of China,Hefei 230026,People's Republic of China;School of Physics and Electrical Engineering,Anqing Normal University,Anqing 246011,People's Republic of China;School of Electrical Engineering,University of South China,Hengyang 421001,People's Republic of China)
出处 《Plasma Science and Technology》 SCIE EI CAS CSCD 2018年第12期1-8,共8页 等离子体科学和技术(英文版)
基金 partially supported by the National Magnetic Confinement Fusion Science Program of China(No.2015GB103002) Key Program of Research and Development of Hefei Science Center(No.2017HSC-KPRD002) the Major Program of Development Foundation of Hefei Center for Physical Science and Technology(No.2016FXZY008) the CASHIPS Director’s Funds Grant(No.YZJJ201612)
关键词 plasma diagnostics x-ray two-crystal spectrometer Doppler broadening dielectronicsatellite plasma diagnostics x-ray two-crystal spectrometer Doppler broadening dielectronicsatellite
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