面向FPGA的故障注入测试技术研究

Fault Injection Testing Technique Research for FPGA

FPGA由于自身结构原因,容易在复杂环境中发生故障.为提高系统的可靠性,需要对基于FPGA的故障注入测试技术进行研究.首先,对故障模式进行研究,给出SEU故障注入方法;其次,给出故障注入测试框架;最后,对故障注入过程进行研究给出结论 .该方法可以移除主机与FPGA间的交互时间,并能迅速在实际中应用.

Due to its own structural features, FPGA is prone to fail in complex environment. In order to improve the reliability of the system, it is necessary to study fault injection testing technology for FPGA. In this article,the failure mode is studied firstly and the method of SEU fault injection is given. Then the fault injection test framework is proposed. Finally, the fault injection process is presented and the conclusion is given. This method can remove the interaction time between the host and the FPGA, and can be applied in practice quickly.