计算机辅助测试性设计中的测试性改善最大化问题研究

Research on Testability Improvement Maximizing in Computer-aided Designing for Testability

基于边界扫描的计算机辅助电路板测试性设计中,面临着“设计复杂性一定时,如何权衡设计使得测试性改善最大”的问题。文章首先建立了该问题的数学描述,然后提出了求解问题的优化算法。仿真实验表明,该算法能够得到较优化的电路板测试性设计方案。

When computer-aided designing for testability based on Boundary-Scan,it exits the problem that is how to optimal design to maximize the testability improvement when the designing complicacy is definite.In this paper,the mathematic description of this problem is established and an optimal algorithm is proposed.The experiments show that the algorithm can get optimal design scheme.