摘要
A new scheme focusing on the surface plasmon polariton interferometry between the metal and dielectric interface is introduced. The phase shift is measured by using surface plasmon polariton wave, generated at the interface of metallic and dielectric media. The phase shift of SPPs is modi?ed under phase and amplitude control of complex conductivity for interferometry. The control ?elds strongly in?uence the phase shift of SPPs for detection of molecular motion. The phase shift of SPPs is further modi?ed by Plasmon polariton Fizeaus dragging effect. We measure 20%–25%fractional change in delay and their phases shift between two left and right SPPs modes. Our results may have signi?cant applications in sensor interferometer technology.
A new scheme focusing on the surface plasmon polariton interferometry between the metal and dielectric interface is introduced. The phase shift is measured by using surface plasmon polariton wave, generated at the interface of metallic and dielectric media. The phase shift of SPPs is modi?ed under phase and amplitude control of complex conductivity for interferometry. The control ?elds strongly in?uence the phase shift of SPPs for detection of molecular motion. The phase shift of SPPs is further modi?ed by Plasmon polariton Fizeaus dragging effect. We measure 20%–25%fractional change in delay and their phases shift between two left and right SPPs modes. Our results may have signi?cant applications in sensor interferometer technology.
