摘要
A new approach to repair memory chips with redundancy is proposed.This approach is based on the minimization of the repair cost.Algorithms for cost driven repair are presented.The algorithms can be ex- ecuted either on-line(concurrently with the testing of the memory),or off-line(at completion of testing). Analytical expressions for the repair cost under both circumstances are given.The presented algorithms are also perfect in the sense that they can correctly diagnose a repairable/unrepairable memory and find the optimal repair-solution.
A new approach to repair memory chips with redundancy is proposed.This approach is based on the minimization of the repair cost.Algorithms for cost driven repair are presented.The algorithms can be ex- ecuted either on-line(concurrently with the testing of the memory),or off-line(at completion of testing). Analytical expressions for the repair cost under both circumstances are given.The presented algorithms are also perfect in the sense that they can correctly diagnose a repairable/unrepairable memory and find the optimal repair-solution.
基金
This research is supported in part by grants from AT&T and NATO.
