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New dark current component of InGaAs/InP HPDs confirmed by DLTS

New dark current component of InGaAs/InP HPDs confirmed by DLTS
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摘要 NewdarkcurrentcomponentofInGaAs/InPHPDsconfirmedbyDLTSWANGKaiyuan,XUWeihong(Dept.ofElectronicEngineering,SoutheastUniversity,... The dark current of In_(0.47) Ga_(0.53) As/InP heterojunction photodiodes (HPDs) was analysed. We found that there exists a new dark current component──deep level-assisted tunnelling current.DLTS was used to measure the In_(0.47)Ga_(0.53)As/InP HPDs. An electronic trap which has a thermal activation energy of O.44 eV, level concentration of 3.10×10 ̄(13)cm ̄(-3) and electronic capture cross section of 1.72×10 ̄(12)cm ̄2 has been found.It's existence results in the new tunnelling current.
出处 《Semiconductor Photonics and Technology》 CAS 1995年第1期20-23,共4页 半导体光子学与技术(英文版)
关键词 发光二极管 特征测度 暗电流 光纤通信 磷化铟 铟镓砷三元化合物 Photodiodes,Characteristic Measurement,Dark Current,Tunnelling Current
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