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On the Input Probability for Built-in Test

On the Input Probability for Built-in Test
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摘要 in this paper ,based on the butlt-in self-test technique to logic circuil ,a nme approach is pro-posed to optimize input probability of digital circuit. After the worst faults are found and their circuitmodel are created the output signals of these models will be compressed by “1” counter. Fault detectprobabilities for the worst faults can be obtained by analyzing compact data. Finally, using the relationbetween the input probability and the fault detect probabilily ,we propose a new algorithm to optimzethe primary input probainlily of the circuit. So the shortest test length can he received. in this paper ,based on the butlt-in self-test technique to logic circuil ,a nme approach is pro-posed to optimize input probability of digital circuit. After the worst faults are found and their circuitmodel are created the output signals of these models will be compressed by “1” counter. Fault detectprobabilities for the worst faults can be obtained by analyzing compact data. Finally, using the relationbetween the input probability and the fault detect probabilily ,we propose a new algorithm to optimzethe primary input probainlily of the circuit. So the shortest test length can he received.
出处 《The Journal of China Universities of Posts and Telecommunications》 EI CSCD 1994年第2期30-35,共6页 中国邮电高校学报(英文版)
关键词 built-in self-test fault detect signal compaction probabilily optimum built-in self-test ,fault detect ,signal compaction ,probabilily optimum
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