探讨硅铁中硅的测定方法

Discussion on the Determination Method of Silicon Content in Ferrosilicon

采用X -射线衍射K值法测定了硅铁中硅的含量 ,测定时以碳酸钙为参比物质 ,选用高纯度的硅做为标样 ,测得的K值为 2 .0 2 7.用此值测定的结果的相对标准偏差分别为 0 .2 9,0 .1 9,用t检验法测得出t分别为 1 .73 ,2 .2 3 ,均小于t0 .0 5,2 (4 .3 0 ) 。

The silicon content in ferrosilicon was determined by K value method of X ray diffraction. The high purity silicon was the reference standard substance, the calcium carbonate was the contrastive substance, so the K value was 2.027, which was used to measure the silicon content in ferrosilicon, the results of K value method of X ray diffraction showed that the relative and standard deviation was 0.29,0.19, respectively. t inspection method showed that t value was 1.73,2.23, respectively, bothvalues were less than t 0.05,2 (4.30), this showed that there was no system error comparing with the standard method for K value method of X ray diffraction.