摘要
This paper resents a new X-ray imaging method swing Laminography(SL) that is suitalble to perform non-destructive testing on the slender-shaped multi-layer samples.Computer simulations are made to compare the limited projections in SL and the principle of choosing Optimal Projection Angular Region(OPAR) is discussed.The experiment on a two-layer Printed Circuits Board shows that SL with 120° swing angles distributed in OPAR can get the separated images of each layer.
