航天电子产品金属晶须形成机理、危害及抑制措施分析

Metal Whisker Growth Mechanism,Harm Analysis and Suppression Method of Aerospace Electric Product

金属晶须自发生长是材料科学中长期受到关注的科学现象。随着航天电子产品集成度的提高,由金属晶须自发生长引起的短路和电子故障问题对航天电子产品的可靠性构成了潜在的威胁。因此,研究金属晶须的生长规律,分析金属晶须的生长机理,探寻抑制金属晶须生长的技术手段成为当前研究的热点。针对近年来国内外对金属晶须生长现象的一些相关研究进行了分析,主要包括金属晶须的生长行为、各种影响金属晶须生长的因素、解释锡晶须生长机理的理论等。结合航天型号金属晶须生长导致的故障,对晶须危害进行了分析,并提出了金属晶须抑制的常用措施。

Spontaneous growth of metal whisker is an important phenomenon,which gets lots of attention from researchers during a long time.With the technology of electronics integration develops,faults of aerospace electronic products which are caused by the growth of metal whisker impose potential threats on reliability of aerospace electronic products.As a result,the study on the theory of spontaneous growth of metal whisker is a hot subject to restrain metal whisker from growth.In this paper,the recent studies around the world which is about the phenomena of spontaneous growth of metal whisker are analylzed,including the behaviour of metal whisker growth,the growth factors and the theory to explain the growth of metal whisker.In the end,the harm upon spacecraft caused by metal whisker is studied,and some general restraining measures are proposed.