扫描测试和扫描链的构造

The Scan Test and the Construction of Scan Chain

本文首先论述了扫描设计与测试向量自动生成（ATPG）这种测试方法的关键技术，并由此为依据，提出部分扫描设计中，扫描链构造的分层次的三个选取原则。

By introducing some key techniques in the combinaion of scan design and automatic test pattem generation (ATPG), this paper presents three hierarchical design criteria to apply partial scan in practice.