期刊文献+

基于双基区晶体管的负阻特性静态随机存储单元电路的设计

A New Design of SRAM Cell Based on Negative Resistance Characteristic of DUBAT
下载PDF
导出
摘要 双基区晶体管是一种硅基三端压控型负阻器件,它的Ic—Vbe曲线具有双稳态特性。利用双基区晶体管的负阻、高速特性构成的静态随机存储电路,结构简单、器件数量少、噪声容限大抗干扰能力强、速度快。将4v时钟信号作为器件的驱动电源,降低了电路功耗。 Dual Base Transistor(DUBAT) is a silicon three-terminal voltage-controlled negative resistance device and has a bi-stability hysteresis loop in the Ic—Vbe characteristics.Applying the negative resistance and the high-speed characteristics of the Dual Base Transistors(DUBAT) to constitute the cell of the Static Random Access Memory(SRAM),which has a simple structure,a few devices,big noise margin so there's strong anti-jamming compatibility,and high-speed.Making the 4 voltage clock-signal drive the MOS FET,which reduce the power of the cell.
出处 《电脑知识与技术》 2010年第3X期2251-2252,共2页 Computer Knowledge and Technology
关键词 双基区晶体管 静态随机存储器 负阻器件 DUBAT SRAM negative resistance device
  • 相关文献

参考文献3

  • 1清华大学电子学教研组编,阎石主编.数字电子技术基础[M]. 高等教育出版社, 2006
  • 2Guo Weilian,Zheng Yuanfen."The Voltage Controlled Current Bi-stability (DUBAT)in DUBAT"[].Solid-State and Integrated Circuit Technology ProceedingsInternational Conference on.1998
  • 3Paul van der Wagt,Alan Seabaugh."RTD/HFET Low Standby Power SRAM Gain Cell"[].Electron Devices Meeting International.1996

共引文献10

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部