2[2]Scott Leavy Honeywell Space Systems,Test report for single event effects testing of Performance Semiconductor(PACE) 1750A Central Processing Unit.July 31,1998.
3PETERSEN E L. The SEU figure of merit and proton upset rate calculations [J]. IEEE Trans. Nuel. Sci.,1998, 45(6).
4BARAK J. On the figure of merit for SEU rate calculations[J]. IEEE Trans. Nucl. Sci., 1999, 46(6).
