摘要
高频开关动作产生的振荡对数字采样有一定的影响,以Boost型PFC电路为例,分析了受影响区间,进而提出线性外推的改进算法。最后把此算法运用到一个实验模型中。
The oseillation brought bythe operational high-frequeney switching will influcnce the sampling data seriotisly because the switching notse coupled to the current sensor.Base on the smgle-phase Boost-type PFC eircint,the distorted area is analyzed and an improved algorithm named line-extension is presented.The novel sampling algorithm shows its feasibility in a prototype.
出处
《电源技术应用》
2002年第10期14-16,共3页
Power Supply Technologles and Applications
