摘要
本文给出了等厚干涉牛顿半环，分析了薄膜台阶产生的反射牛顿半环，并给出了利用牛顿半环测薄膜厚度的方法。
?In this paper, equal thickness interference Newtow’s half -rings have been shown in detail. Thin films step Newtows half-rings have been analysed. At last, we have given the method measuring the thickness of thin film by Newton’s half-rings.
出处
《湘潭师范学院学报（社会科学版）》
1994年第6期80-82,共3页
Journal of Xiangtan Normal University(Social Science Edition)
关键词
牛顿半环
薄膜台阶
等厚干涉
Newton’s half-ring
thin films step
equal thickness interference
