6National instrument. TestStand user Manual [M].Teststand online help, April 2007.
7Hirabayashi A, Ogawa H, Kitagawa K. Fast surface profiler by white-light interferometry by use of a new algorithm based on sampling theory [J]. Applied Optics, 2002, 41 (23): 4876- 4883.
8Oike Y, Shintaku H, Takayama S, et al. Real-time and high-resolution 3D imaging system using light-section method and smart CMOS sensor[J]. Sensors, 2003, Proceedings of IEEE, 2003,1(1) : 502-507.
9Cheon J M,Chae Y C,Kim D S, et al. Smart CMOS image sensor with high SBR and subpixel resolution for light-section- based range finding [J]. IEEE Transactions on Electron Devices, 2009,56(11):2546-2555.
10Pradhan S.sen S.An improved lead compensation technique for three-wire resistance temperature detectors.IEEE Trans.on Instrumentation and Measurement,1999,48(5)
