摘要
FPGA是在PAL、GAL、EPLD、CPLD等可编程器件的基础上进一步发展的产物。它是作为ASIC领域中的一种半定制电路而出现的,既解决了定制电路的不足,又克服了原有可编程器件门电路有限的缺点。用Ultra Flex测试系统(ATE)测试FPGA的方法进行阐述,分析了不同电压模式的配置文件产生方法的差异。
FPGA is developed based on PAL, GAL, EPLD, CPLD programmable application. It is showed as a half customized circuit. It solves the problems of customized circuit and overcomes the shortcoming of former programmable application. This text explains the working theory of UltraFlex(ATE)integrated operational testing method, analyses the difference of conifguration ifles between different voltage standard.
出处
《电子与封装》
2015年第7期10-13,共4页
Electronics & Packaging