期刊文献+

基于SIFT算法的疵病图像配准 被引量:5

Defect image registration based on SIFT algorithm
下载PDF
导出
摘要 光学技术的发展对光学元件提出了更高的要求,检测的精度和准确性是其重要的部分,而疵病图像的配准是一个很重要的环节,因此对疵病图像的配准进行研究很有必要。针对疵病图像配准算法进行了阐述,并对基于特征点匹配的SIFT算法的原理及过程进行了介绍,用MATLAB软件进行编程,搭建实验平台获取疵病图像,并采用尺度不变特征变换(SIFT)算法对所获取的疵病图像进行配准、拼接,得到了完整的疵病图像。实验结果表明,该算法能有效地对疵病图像进行配准,为后续的疵病信息提取打下良好的基础。 With the development of optical technology,higher requirements have been put forward for optical components.The accuracy and veracity of detection is an important part of optical components.The registration of defective images is a very important link.Therefore,it is necessary to study the registration of defective images.Aiming at the defect image registration algorithm,the principle and process of SIFT algorithm based on feature point matching are introduced.The experimental platform is programmed by MATLAB software to obtain the defect image.The defect image is registered and mosaic by SIFT algorithm,and the complete defect image is obtained.The experimental results show that the algorithm can effectively register the defect image and lay a good foundation for the subsequent defect information extraction.
作者 刘璐 刘缠牢 Liu Lu;Liu Chanlao(School of Optoelectronic Engineering,Xi’an Technological University,Xi’an 710021,China)
出处 《电子测量技术》 2019年第6期94-98,共5页 Electronic Measurement Technology
关键词 疵病检测 疵病信息提取 特征点 图像配准 SIFT算法 defect detection defect information extraction feature points image registration SIFT algorithm
  • 相关文献

参考文献5

二级参考文献56

  • 1李晓明,郑链,胡占义.基于SIFT特征的遥感影像自动配准[J].遥感学报,2006,10(6):885-892. 被引量:153
  • 2周颜军.数据结构[M].长春:吉林科学技术出版社,2003.
  • 3Moravee H P. Towards Automatic Visual Obstacle Avoidance[C]l/ Proc. of the 5th International Joint Conference on Artificial Intelligence. [S. l.]: Springer-Velag, 1977.
  • 4Harris C, Stephens M. A Combined Corner and Edge Detector[C]// Proc. of the 4th Alvey Vision Conference. Manchester, UK: [s. n.], 1988.
  • 5Lowc D G, Distinctive Image Features from Scale-invariant Keypoints[J]. International Journal of Computer Vision, 2004, 60(2): 91-110.
  • 6Mikolajczyk K, Schmid C. A Performance Evaluation of Local Descriptors[J]. IEEE Transactions on Pattern Analysis and Machine Intelligence, 2005, 27(10): 1615-1630.
  • 7Yan Ke, Sukthankar R. PCA-SIPT: A More Distinctive Repre- sentation for Local Image Descriptors[C]//Proc. of CVPR'04. [S. l.]: IEEE Press, 2004.
  • 8Mortensen E N, Deng Hongli, Shapiro L. A SIFT Descriptor with Global Context[C]//Proc. of CVPR'05. San Diego, California, USA: IEEE Press, 2005.
  • 9Moreno P, Bernardino A, Victor S J. Improving the SIFT Descriptor with Smooth Derivative Filters[J]. Pattern Recognition Letters, 2009, 30(1): 18-26.
  • 10Petrou K A, The Trace Transform and Its Applications[J]. IEEE Transactions on Pattern Analysis and Machine Intelligence, 2001, 23(8): 811-828.

共引文献127

同被引文献52

引证文献5

二级引证文献15

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部