摘要
针对现阶段数字散斑干涉内窥测量技术只能间接测量物体面内变形的问题,提出了一种双路照明的内窥式数字散斑干涉面内变形直接测量的方法,避免了离面变形对面内变形测量的影响。通过在相移式数字散斑干涉技术中结合内窥镜进行测量,并且使用对称分布的多模光纤形成双光路照明,实现了对空腔、深孔或被遮掩物面内形变的高精度测量。实验实现了入口直径为40 mm的空腔内部面内变形直接测量,当工作距离为20 mm时,测量面积可达到300 mm^2,测量分辨率达到68 nm。
In view of the problem that the traditional endoscopic digital speckle pattern interferometry(DSPI)can only measure the in-plane deformation indirectly,a method of direct measurement of the in-plane deformation using a dual-beam-illumination endoscopic DSPI is proposed to avoid the influence of the out-of-plane deformation on the in-plane deformation.High-accuracy measurement of the in-plane deformation of surface inside cavity,deep hole,or hidden object is achieved by combining the phase-shifting DSPI with an endoscope and using symmetrically distributed multimode fibres to generate a dual-beam illumination.In the experiment,a direct measurement of the in-plane deformation inside a cavity with inlet diameter of 40 mm is realized.The measuring area can reach 300 mm2 at a working distance of 20 mm and the measurement resolution reaches 68 nm.
作者
袁腾飞
吴思进
李伟仙
杨连祥
Yuan Tengfei;Wu Sijin;Li Weixian;Yang Lianxiang(School of Instrumentation Science and Opto-electronics Engineering,Beijing Information Science and Technology University,Beijing 100192,China;Department of Mechanical Engineering,Oakland University,Rochester MI 48309,USA)
出处
《电子测量与仪器学报》
CSCD
北大核心
2019年第7期93-98,共6页
Journal of Electronic Measurement and Instrumentation
基金
国家自然科学基金(51675055,51705025,11672045)
北京信息科技大学“勤信人才”培育计划(QXTCP B201702)
北京市教委科研计划项目(KM201711232003)资助
关键词
数字散斑干涉
内窥测量
面内变形
对称照明
digital speckle pattern interferometry
endoscopic measurement
in-plane deformation
symmetrical illumination