光栅投影三维轮廓测量及关键技术分析

3-D Profilometry Measurement Using Grating Projection and Key Techniques Analysis

说明了光栅投影三维测量技术的原理 ;就国内外的研究和应用状况 ,对三维测量中的关键技术 ,如相位测量、解相位、数据配准和拼接。

The principles of 3 D measurement are reviewed briefly first.On the basis of current research and application,some key techniques,including phase demodulation,phase unwrapping,physical discontinuities,data registration and connection and system optimization and calibration,are inverstigated in detail.