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Mn掺杂BST薄膜的制备与表征 被引量:15

Preparation and Characterization on the Mn-Doped BST Thin Film
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摘要 采用醋酸水溶液体系溶胶 -凝胶法制备了未掺杂和掺 Mn( )钛酸锶钡 (BST)薄膜。用这种方法 ,可在BST体系中容易地加入任何浓度的金属离子 ,并可在室温下长期保存。根据 X-射线衍射图 (XRD)和表面形貌 ,薄膜的晶化温度取为 6 5 0~ 75 0°C。根据掺 Mn BST的 Mn2 p3/2 X-射线光电子能谱 (XPS)图中 Mn2 p3/2 的峰位置 ,显示出薄膜中 Mn的价态与加入的 Mn( )离子价态相同。根据结合能的峰移 ,可以得到掺 Mn BST的费密能级降低0 .7e V。 I- V特性和介电特性测试表明 ,掺 Mn( ) BST的漏电流明显降低 ,相对的介电常数增加 ,损耗角正切降低0 .0 1。根据漏电性质、介电常数和损耗的关系 ,2 % (摩尔分数 )的 Mn掺杂的 BST薄膜适合于低频小信号 (2 V以下 ,约 5 0 0 k Hz)应用 ,而高浓度的 Mn掺杂适合于大信号较高频率 (1MHz以上 )应用。 Undoped and Mn(Ⅱ) doped barium strontium titanate (BST) thin films have been prepared by a 'water based' sol gel method.With this method,BST stock solution can be easily doped with any concentration of aqueous metal ion solution and can be stocked for more than a month at room temperature.The crystallization temperature of 650~750 °C is suitable for the films from the results of both the X ray diffraction (XRD) patterns and the surface topography.The Mn2p 3/2 X ray photoelectron spectra (XPS) pattern of the BST thin film shows that the valence state of the Mn doped BST has a same valance as the Mn(Ⅱ) dopant.Considering the peak shift of the binding energy,it is proposed that the fermi level of the Mn doped BST has been shifted down by 0 7 eV.The leakage current and dielectric loss of the BST films have been greatly reduced due to the Mn(Ⅱ) doping.
出处 《压电与声光》 CAS CSCD 北大核心 2002年第5期389-391,403,共4页 Piezoelectrics & Acoustooptics
基金 国家"九七三"(G19990 3 3 10 5 ) 清华大学"九八五"基金和"新型陶瓷与精细工艺国家重点实验室开放课题"资助项目
关键词 MN掺杂 BST薄膜 溶胶-凝胶法 X-射线光电子能谱 I-V特征 介电性质 BST thin film Mn(Ⅱ) doped Sol Gel XPS dielectric properties
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  • 1[1]KINGON A I,MARIA J P,STREIFFER S K.Alter native dielectics to silicon dioxide for memory and logic devices[J].Nature,2000,406(31):1 032-1 038.
  • 2[2]LIOU J W,CHIOU B S.Dielectric characteristics of doped Ba1-xSrxTiO3 at the paraelectric state [J].Materials Chemistry and Physics,1997,51(1):59-63.
  • 3[3]DAWBER M,SCOTT J F,HARTMANN A J.Effect of donor and acceptor dopants on Schottky barrier heights and vacancy concentrations in barium strontium titanate [J].J Europ Ceram Soc,2001,21(10-11):1 633-1 636
  • 4[4]SEDLAR M,SAYER M,WEAVER L.Sol-Gel processing and properties of cerium doped barium strontium titanate thin films [J].Journal of Sol-Gel Science and Technology,1995,5(3):201-210.
  • 5[5]MOULDER J F,STICKLE W F,SOBOL P E,et al.Handbook of X-ray photoelectron spectroscopy [M].Perkin-Elmer,Minneapolis,1992.
  • 6[6]ARILLO M A.Surface characterization of spinels with Ti(IV) distributed in tetrahedral and octahedral sites [J].Journal of Alloys and Compounds,2001,317-318:160-163.
  • 7[7]ROBERTSON J,CHEN C W.Schottky barrier heights of tantalum oxide,barium strontium titanate,lead titanate,and strontium bismuth tantalate [J].Appl Phys Lett,1999,74(8):1 168-1 170.

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