摘要
介绍了集成电路可测性设计的概念和分类方法,然后以数字调谐系统芯片DTS0614为例,具体介绍了其中的一种即针对性可测性设计方法,包括模块划分、增加控制线和观察点。最后给出了提高电路可测性的另一种方法——内建自测试方法。
The concept and classification of design for testability about IC are introduced. One method of design for testability which called special design for testability methodology is given based on DTS0614, include module division, control line and observation point adding into the circuit. And the another way of design for testability which is build-in self test is introduced.
出处
《半导体技术》
CAS
CSCD
北大核心
2002年第9期9-13,共5页
Semiconductor Technology