表面粗糙度间距参数S_m与S测量方法的探讨

Measurement of Single Peak Distance and Contour Micro - plainness Distance

讨论了Sm、S参数概念阐述及测量表面粗糙度间距参数Sm、S的探针法、光切法、干涉法和照相法。分析了四种方法的长处与欠缺,提出了如何选择测量法的几点建议。

This paper introducss the concept of distance parameters Sin and S and their measurement methods: probe method, light section technique, interferometry and photogrammetry. The paper also discusses the advantages, disadvantages of the above four methods and their applications.