摘要
简要讨论了全息 CT测量原理 ,理论上证明根据实时全息干涉图的强度分布测量待测物体折射率三维 (3- D)变化的可行性 ;利用计算机对轴对称介质折射率变化的全息 CT干涉条纹进行模拟研究 ,并给出模拟研究的应用实例。
The principle of holographic CT measurement is introduced briefly, and the possibility of measuring the 3-dimension (3-D) variation of the deflection index from the intensity distribution of the holographic interferogram is proved theoretically. Based on this method, simulated study on calculating the variation of deflection index of an axis symmetry media is made by computer and the example of application is also presented in this paper.
出处
《光电子.激光》
EI
CAS
CSCD
北大核心
2002年第10期1026-1030,共5页
Journal of Optoelectronics·Laser