电子镇流器中电容器失效分析

The Failure Analysis of the Capacitors Used in Electronic Ballast

简述了电子镇流器的工作原理,分析了几种电容器失效的模式并进行了机理推测,通过试验分析和实体分析,得出失效的主要原因有:电容器的Res值偏大、纹波电流过载、有害杂质的破坏、铝箔变性、阴极箔水合作用及电网电压异常波动等因素,最后提出了改进电容器性能的措施。

The operation principle of ballasts is presented. After a number of experimental and disassembling analyses, the important failure causes have been found. They are higher ESR, overload ripple current, destruction by the foreign maters, abnormal voltage variation in the local power supply network, etc. Some measures for improving the properties of the capacitors are put forward.