摘要
三维物体表面轮廓测量是获取物体形态特征的一种重要手段 ,在机器视觉、自动加工、工业检测、产品质量控制领域具有重要意义和广阔的应用前景。光学非接触测量由于其高分辨率、无破坏、数据获取速度快等优点而被认为是最有前途的三维形貌测量方法。介绍了光学非接触测量方法中的光切法、基于调制度测量的原理及优缺点 ,重点介绍了光栅投射法的测量原理 ,并分析了其研究热点与发展方向。
D profile measurement is becoming a powerful tool for obtaining the form and structure of an object. It has important significance and widespread applications in machine vision, automatic measurement, industrial inspection, quality control, etc. Because of the advantages of high resolution, non-distruction, and quick data-obtaining, etc., it is thought to have a great future. This paper introduces some new techniques of the 3D profile measurement such as the light-section method, MMD method, and emphasizes the grating projection measurement method, giving both their advantages and disadvantages, as well as the current hot points and future directions of the last one.
出处
《光学精密工程》
EI
CAS
CSCD
2002年第5期528-532,共5页
Optics and Precision Engineering
