KCl:Pb^(2+)单晶中的低频喇曼信号及相应的点缺陷

Low frequency Raman signal in KCI:Pb^(2+) single crystal and corresponding point defect

在绝对温度77K经x射线辐照后的KCl:Pb^(2+)单晶中观察到一个频移为30cm^(-1)的低频喇曼信号.结合测量信号强度随x射线辐照时间的变化及F带光对相应的点缺陷的影响,推断这一低频信号可能起因于被杂质铅稳定的填隙氯离子的局域振动.

A low frequency Raman signal with 30cm^(-1) frequency shift is observed in KCI:Pb^(2+)single crystal after x-ray irradiation at the temperature 77K. In combination with the measurement of the variation of the Raman intensity as a function of x-irradiation duration and the effect of F-band light onthe defect,it is derived that the low frequency signal is probably caused by the local vibration of an interstitial ion C1^- stabilized by an impurity ion Pb^+.