摘要
传统板级硬件功能验证方法使用示波器或逻辑分析仪对引出管脚进行测试,灵活性差,不适用于星载大容量NAND FLASH存储阵列。提出一种通过FPGA控制NAND FLASH复位和读ID操作,并自动遍历所有存储芯片的方法,配合Chip Scope Pro工具在线仿真,实现星载NAND FLASH板级功能快速验证。实验结果表明,该方法简单有效,并可根据仿真验证结果快速做出板级功能有效性判断。
The traditional board?level hardware functional verification method uses the oscilloscope or logic analyzer to testthe outlet pins,which has poor flexibility,and is unsuitable for the high?capacity satellite?bone NAND FLASH storage array. Amethod to control the NAND FLASH reset,read ID operation through FPGA and traverse all storage chips automatically is pro?posed in this paper. In combination with the ChipScope Pro tool,the online simulation is used to fast verify the satellite?boneNAND FLASH board?level function. The experimental results show that the method is simple and effective,and can quicklyjudge the board?level function effectiveness according to the simulation results.
作者
董振兴
朱岩
DONG Zhenxing;ZHU Yan(Key Laboratory of Electronics and Information Technology for Space Systems,Chinese Academy of Sciences,Beijing 100190,China;National Space Sciences Center,Chinese Academy of Sciences,Beijing 100190,China;University of Chinese Academy of Sciences,Beijing 100190,China)
出处
《现代电子技术》
北大核心
2016年第14期32-34,38,共4页
Modern Electronics Technique
基金
中国科学院空间科学战略性先导科技专项(KX-4)
