一种利用短基线程差测量值递推长基线几何参数的方法

Method for Long Baseline Geometric Parameters Recurred by Short Baseline Path Difference Measurements

利用单基中点相差测向式可导出了适用于任意基线长度的相差变化率测距式,利用相差变化率的多通道检测方式,可将相差变化率测距式改写成基于程差差分的函数。在此基础上,可导出对应于长短基线的单位长度上程差差分函数的比例关系式,由此就能利用短基线一维双基阵列的程差测量值递推得到基于虚拟长基线的一维双基阵列的几何参量,由此还能实现基于虚拟长基线的定位测量。

The difference rate of change DF which applied to all length of baseline is derived by the median point of single baseline DF. By using the multi-channel, the difference rate of change DF can change into the function of path difference. The proportion relationship of path difference is derived, so the geometric parameters of one dimensional double baseline based on virtual long baseline is recurred by using the path difference measurement of short baseline and then the positioning measurements based on the virtual long baseline are realized.