摘要
The reconfigured field-programmable-gate-arrays (FPGAs) have been widely used in aerospace electronic systems because of their abilities of flexible reconfiguration and lower costs. To ensure the reliability of FPGAs to single event effects, the radiation-hardened programmable-read-only-memory (PROM) is used to refresh the FPGAs. When soft errors such as single event upset (SEU) occurred in FPAG, the initial programming sequence stored in PROM can be loaded to the FPGAs. So, it is crucial to characterize the single event effects of PROM devices for their applications in space[1;2].
