水稻穗部籽粒参数快速无损获取方法研究

Study on fast and nondestructive method of rice grain parameters acquisition of rice panicle

为满足现代育种技术在短时间内对大量的水稻穗部性状进行测量的需求,提出一种基于X射线的水稻穗部籽粒参数的快速无损获取方法,方法分析了射线管电压和电流对穗部成像质量的影响,通过高斯平滑和多阈值分割计算实粒个数,通过形态学处理和图像比对计算水稻空秕粒个数,通过水稻外接圆的直径长度计算稻壳内粒长。选取三十株水稻样本进行X射线成像,并进行实粒、空秕粒和粒长分析。结果表明,水稻实粒数测量值和真实值的绝对误差保持在±3的误差内,空秕粒的准确率也能达到88%,粒长检测的绝对误差均小于0.13 mm,将其应用到实验检测中,证实了该方法整体的可靠性。

For the measurement of large panicle rice in a short period of time to meet the demand of modern breeding technology,it puts forward a kind of fast nondestructive method of grain parameters acquisition of rice panicle based on X ray.The method analyzes the influence on the imaging quality of the ear grain by the X-ray tube voltage and current,calculates the number of filled grain by Gauss smooth and multi-threshold segmentation,the rice empty grain number is calculated through morphological processing and image alignment,the rice husk length is obtained by means of calculating the diameter of the circumcircle of rice grain.Thirty rice samples are selected for X-ray imaging,and grain,empty grain andgrain length analysis.The results show the measurement value of rice filled grains and the true value of the absolute error within±3,the accuracy of empty grain number can reach88%,the absolute error of grain length is less than0.13mm.And the application verifies the reliability of the whole method.