硫酸氧钒溶液中硅含量的测定研究

Research on the Determination of silicon in Vanadium Sulfate

采用电感耦合等离子体原子发射光谱法和分光光度法,研究了硫酸浓度、盐酸浓度、盐酸与硫酸共同作用对硫酸氧钒溶液中硅含量的测定的影响,并对两种方法的测试结果进行了对比,实验结果表明两种方法的测试结果基本吻合,相对标准偏差不大于10%,硅回收率在95%-105%。电感耦合等离子体原子发射光谱法操作简便,受外界影响波动小。

The effect of the concentration of sulfuric acid,the concentration of hydrochloric acid,and the interaction of hydrochloric acid and sulfuric acid on the determination of silicon content were study in oxygen vanadium sulfate solution by inductively coupled plasma atomic emission spectrometry and spectrophotometry,and the testing results of two methods were compared.The experimental results show that the testing results of two methods were almost consistent,the relative standard deviation is less than10%,the recovery rate of silicon was95%-105.But the method of inductively coupled plasma atomic emission spectrometry is simple and easy to operate,small fluctuations affected by the outside world