摘要
介绍了一种针对数字-轴角信号转换芯片的批量测试设备,其基于数字处理芯片,对被测芯片提供驱动电源、角度数字量和参考信号,并回采被测芯片输出的轴角数据,通过计算分析和误差比较,最终完成失效芯片的筛选工作。该设备具备体积小、重量轻的便携式特点,可配合多种晶圆测试平台。
The design and realization of a new type testing equipment,for batch testing with digital axial angular conversion chip.Based on the digital processing method,the measured power supply,the angle digital quantity and the excitation signal are provided to the tested chip,and the shaft angle data of the measured chip output is received.Through the analysis and error comparison,the failure chip is finally finished.The device has a small size,light weight characteristics,it is easy to carry,and can effectively cooperate with a variety of the wafer test platform.
作者
颜玲龙
Yan Ling-long(Lian Yungang JARI Electronic Company Limited,Jiangsu Lianyungang 222006)
出处
《电子质量》
2017年第8期40-43,共4页
Electronics Quality