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LDO芯片CP通用测试方法研究 被引量：1

Research on General CP Test Method of LDO Chip
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摘要 介绍了LDO(线性稳压器)的通用测试方法。基于长川CTA8280测试系统,通过对芯片CP(圆测试)要求进行分析,设计了某款LDO芯片的测试外围,实现了对该LDO芯片功能与性能的测试。该方案能够作为通用测试方法供LDO芯片测试设计参考。 Introduced a general test method of LDO(LowDrop Out)Circuit Probing test.In the paper,based on the CTA8280test system,by analyzing the requirements of LDO wafer test,the chip peripheral test circuit is designed,which is able to realize testing the function and performance of the LDO chip.This scheme can be used as a general test method for reference of LDOchip test design.
作者 唐彩彬 张凯虹 TANG Caibin;ZHANG Kaihong(China Electronics Technology Corporation No.58 Research Institute, Wuxi 214035, China)
机构地区 中国电子科技集团公司第五十八研究所
出处 《电子与封装》 2017年第11期15-18,共4页 Electronics & Packaging
关键词 LDO CTA8280 CP 熔丝 LDO CTA8280 CP fuse
分类号 TN407 [电子电信—微电子学与固体电子学]
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电子与封装
2017年 第11期

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