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超级电容容量衰减识别设计与应用

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摘要 基于ARM-comterx-M3内核的STM32107微处理,利用充放电过程中固定的时间长度,以及容量衰减后的变化特性,设计容量衰减识别算法,在线监测超级电容容量,及时定位容量发生衰减的超级电容单体。
作者 翟昊宇
出处 《技术与市场》 2018年第4期114-114,116,共2页 Technology and Market
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