基于半导体制冷元件的新型湿度测量器

The Design and Fabrication of a New Type Humidity Measuring Device Based on Semiconductor Refrigeration

在探索新型湿度测量原理,利用温差、湿度与水蒸气液化速率的关系制作一个能够形成恒定温差的装置,进一步通过测量温差和恒定温差表面的水分含量得到空气的湿度。设定一个环境湿度的标定值作为对照,衡量自制湿度器所得结果的可靠性。

The aim is to explore a new theory of humidity measuring.Based on the relations among difference in temperature,humidity and the rate of water vapor’s liquefaction,the new device can be designed with a constant difference in temperature,and then the value of humidity is able to be obtained by measuring the temperature difference as well as the moisture content of a certain surface with a constant difference in temperature.Moreover,a standard humidity value is necessary to be set as a scientific control in order to conveniently evaluate the reliability of the result generated by the new device.