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面向GJB5000A三级的测控软件缺陷管理系统的设计与应用 被引量:1

Design and Implementation of GJB5000A-tertiary-oriented TT&C Software Defect Management System
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摘要 软件缺陷管理是软件工程化和GJB5000A的重要内容。为了更好地进行软件缺陷管理,提高软件工程化水平,针对航天测控软件的特点,设计一个符合GJB5000A三级要求的测控软件缺陷管理系统。通过在多个项目中应用实践,证明测控软件缺陷管理系统对软件质量管控、软件测试问题闭环都有明显的作用,同时也证明缺陷统计分析对于提高团队开发效率和软件产品质量效果明显。 Software defect management is an important part of the GJB5000A and software engineering.According to the characteristics of the TT&C software,this paper proposes a GJB5000A-tertiary-oriented software defect management system.This designment is proved obviously effective to the software quality control and closeloop of software testing.Also the software defect statistics and analysis are useful for the improvement of both software development efficiency and software product quality.
作者 赵聆 仇雯钰 翟继增 朱宏涛 Zhao Ling;Qiu Wenyu;Zhai Jizeng;Zhu Hongtao(Beijing Research Institute of Telemetry,Beijing 100094,China)
出处 《遥测遥控》 2018年第1期66-72,共7页 Journal of Telemetry,Tracking and Command
基金 航天系统"十三五"预研项目支持
关键词 测控软件 软件缺陷管理 GJB5000A三级 TT&C software Software defect management GJB5000A tertiary
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  • 1聂林波,刘孟仁.软件缺陷分类的研究[J].计算机应用研究,2004,21(6):84-86. 被引量:39
  • 2梁成才,章代雨,林海静.软件缺陷的综合研究[J].计算机工程,2006,32(19):88-90. 被引量:19
  • 3[3]Du Wenliang,Mathur A P.Testing for software vulnerability using environment perturbation [J].Quality and Reliability Engineering International,2002,18(3):261-272
  • 4[4]Stevens W R.UNIX网络编程[M].施振川译.北京:清华大学出版社,2001.
  • 5[5]http://www.gd-info.com/down/info/139.htm
  • 6IBM Center for Software Engineering.University Partner-ships. http://www.research.ibm.com/softeng/comm/upp.htm . 2010
  • 7Norm Bridge,Corinne Miller.Orthogonal Defect Classification U-sing Defect Data to Improve Software Development. Soft-ware Quality . 1997
  • 8Michael Fredericks,Victor Basili.Using Defect Tracking and Analysisto Improve Software Quality. A DACS State-of-the-ArtReport . 1998
  • 9IEEE standard classification for anomalies. IEEE Std 1044-1993 . 1993
  • 10Chillarege R,Bhandari I,Chaar J,et al.Orthogonal Defect Classification: A Concept for Inprocess Measurements. IEEE Transactions on Software Engineering . 1992

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