扫描电子显微镜和原子力显微镜对于酵母表面形貌观察的比较分析

Comparative analysis of surface morphology of yeast by scanning electron microscopy and atomic force microscopy

扫描电子显微镜和原子力显微镜均被广泛应用于样品表面形貌的检测分析。本文以正常酵母和富铬损伤后的酵母为研究对象,利用扫描电镜和原子力显微镜分别对正常和破损的细菌整体群落和单个菌株的形貌变化进行比较观察。通过观察结果,分析扫描电镜和原子力显微镜在表面形貌观测上各自具有的特点及优势。将两种观测技术优势性能结合互补,可以得到更加全面、准确的样品表面形貌特性,为两个大型仪器的联合分析提供了理论基础。

Scanning electron microscopy(SEM)and atomic force microscopy(AFM)have been widely used in the analysis of sample surface morphology.In this study,using scanning electron microscopy and atomic force microscopy respectively,the changes of morphologies were compared between normal yeast and chromium enriched yeast in the whole bacterial community and individual strains.Based on the analysis of the observation results,the characteristics and advantages of scanning electron microscopy and atomic force microscopy were obtained.It is possible to obtain the more comprehensive and accurate sample surface topography by combining the advantages of the two techniques,which provides a theoretical basis for the combination of the two instruments.