关于IIC通讯在记忆电路中的竞争冒险问题分析改进

Analysis and Improvement of Competitive Risk in Memory Circuit for IIC Communication

在进行家电产品的硬件电路测试时发现多起记忆电路上电波形异常的问题,本文通过对IIC通讯的概述、竞争冒险现象的简介以及记忆电路上电时序的详细分析,为家电产品开发的设计人员提供可借鉴的改善建议,提早进行设计规避。

We found several memory circuit electric wave abnormal problems when making hardware circuit tests of electrical appliances product,through the overview of IIC communication、brief induction of competitive adventure phenomenon and detailed analysis of memory circuit electric timing,this paper put forward some improvements for electrical appliance products designers.