一种全温下残影评价的测试系统研究

针对残影测试使用点式亮度计无法满足测试要求,面式亮度计价格昂贵且高温测试不易推广的问题,提出了一种新的残影测试系统。通过该系统对同样的样品和面亮度计进行对比测试,测试精度较高,测试误差小,测试结果一致性较好。该系统主要由电脑、光信号探测器、光电信号处理模块3部分组成,该系统可以对显示产品进行常温、高温的残影测试,系统性能可靠、操作简便、测量精度高、价格便宜,并且解决了目前高温残影测试无法定量的问题,适用于特殊环境下的残影测试评价。

In view of the problem that the use point luminometer can not meet the test requirements,the surface luminance meter is expensive and the high temperature test is not easy to be popularized,a new residual shadow testing system is put forward.Through the system,the same sample and surface luminance meter are compared and tested,the test accuracy is high,the test error is small,and the test result is one.The sex is good.The system consists of three parts:the computer,the light signal detector and the photoelectric signal processing module.The system can test the display products at normal temperature and high temperature.The system has reliable performance,easy operation,high measurement precision and cheap price,and it can solve the problem that the present high temperature shadow test can not be quantified.The evaluation of residual shadow test in special environment.