摘要
使用红外热像仪、微光显微镜(EMMI)、聚焦离子束(FIB)、高分辨率透射电子显微镜(HRTEM)和能量色散X射线能谱仪(EDS)等技术手段对在长期老化过程中发生COD的激光器样品进行了失效分析,总结出相应的长期老化失效机理。
The laser diode samples reacted with catastrophic optical damage(COD)during long-term aging process were analyzed by means of infrared thermography,emission microscope(EMMI),focused ion beam(FIB),high-resolution transmission electron microscopy(HRTEM)and energy dispersive X-ray spectroscopy(EDS),and the failure mechanism of long-term aging was summarized.
出处
《环境技术》
2018年第A01期63-67,共5页
Environmental Technology
关键词
半导体激光器
失效分析
失效模式
失效机理
老化
semiconductor laser diodes
failure analysis
failure mode
failure mechanism
aging
