摘要
通过现场调查,以及实验室分析(包括芯片伏安特性检测、X-Ray检测、扫描电镜分析等),找出遥控器的操作不良同其内部使用的LED灯珠的关联性,确认为遥控器出现操作不良与其内部LED灯珠失效存在因果关系。
Through on-site investigations and laboratory analysis(including chip V-I characteristic detection,X-Ray detection,scanning electron microscope analysis,etc.),the relevance of poor operation of the remote controller and its internal use of light emitting diode beads was identified and confirmed as a remote controller.There is a causal relationship between poor operation and the failure of its internal light emitting diode.
作者
卜洁
李正
Bu Jie;Li Zheng(Soochow FALAB Judicial Authenticators,Jiangsu Suzhou 215000)
出处
《电子质量》
2018年第7期80-83,共4页
Electronics Quality